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2025, 12, v.44 26-35
印刷焊料对ABF基板在uHAST及HTST老化后焊接可靠性的影响
基金项目(Foundation):
邮箱(Email):
DOI: 10.19289/j.1004-227x.2025.12.005
摘要:

[目的]研究不同印刷焊料下ABF基板的焊接界面于高加速温湿度应力试验(u HAST)及高温老化试验(HTST)后的金属间化合物(IMC)生长趋势和焊接性能变化。[方法]使用扫描电子显微镜(SEM)、能谱分析仪(EDS)、多功能推拉力试验仪对焊点进行观察和分析。[结果]在u HAST及HTST试验后,化学镀锡样品的IMC层截面呈扇贝状,其俯视形貌为鹅卵石状,化学镀镍钯金(ENEPIG)样品的IMC层截面为枝晶状,其俯视形貌为多面体状。在表面处理工艺相同的情况下,采用SC07焊料时所得IMC层厚度在老化试验期间的厚度始终大于采用SAC305焊料;当焊料相同时,化学镀锡样品的IMC层厚度在老化试验期间始终大于ENEPIG样品,均未出现柯肯达尔空洞。在u HAST过程中,化学镀锡样品的焊接强度呈现下降趋势;在HTST试验过程中,化学镀锡样品的焊接强度呈现上升趋势,而ENEPIG样品的焊接强度均为先上升后下降。[结论]本研究可为ABF基板的设计提供理论参考。

Abstract:

[Objective] The intermetallic compound(IMC) growth behavior and soldering performance evolution of ABF substrates with different printing solders after unbiased highly accelerated stress testing(uHAST) and high-temperature stress testing(HTST) were studied. [Method] The solder joints were observed and analyzed using scanning electron microscopy(SEM), energy dispersive spectroscopy(EDS), and a multi-function push-pull tester. [Result] After uHAST and HTST, the cross-section of the IMC layer in the immersion tin specimens exhibited a scallop-like morphology, with a pebble-like appearance in top-view. In contrast, the electrolessly nickel/electroless palladium/immersion gold(ENEPIG) specimens showed a dendritic IMC cross-section and a polyhedral top-view morphology. For the specimens treated by the same process, the IMC layer thickness with SC07 solder was consistently greater than that with SAC305 solder throughout the aging testing. For the specimens with the same solder, the IMC layer thickness in immersion tin specimens was always greater than that in ENEPIG specimens. No Kirkendall voids were observed in all specimens. During uHAST, the solder joint strength of immersion tin specimens decreased, while it increased during HTST. For the ENEPIG specimens, the solder joint strength initially increased and then decreased during HTST. [Conclusion] This study provides theoretical reference for ABF substrate design.

参考文献

[1]LI Y N, WANG C W, PENG Z L, et al. Dissolution behavior of Cu in Cu-Ag and Cu–P brazing alloys using weld brazing[J]. Transactions of Nonferrous Metals Society of China, 2011, 21(S2):s394-s399.

[2]王坤,孙茜,孙齐政,等.无铅钎料焊点界面组织及性能研究进展[J].热加工工艺, 2024, 53(19):1-9.WANG K, SUN Q, SUN Q Z, et al. Research progress on microstructure and properties of lead-free solder joints[J]. Hot Working Technology, 2024, 53(19):1-9.

[3]MUKHAMETZIANOVA G, WAGNER S, ESKINJA M, et al. Mapping elemental solutes at sub-picogram levels during aqueous corrosion of Al alloys using diffusive gradients in thin films(DGT)with LA-ICPMS[J]. Analytical and Bioanalytical Chemistry, 2024, 416(14):3373-3388.

[4]PARK J W, AHIALE G K, CHOI W D, et al. Effects of Nb addition on the microstructure and low-cycle fatigue properties of heat-resistant stainless steel[J]. Journal of Materials Research and Technology, 2023,27:5772-5782.

[5]ZHANG L, XUE S B, ZENG G, et al. Interface reaction between SnAgCu/SnAgCuCe solders and Cu substrate subjected to thermal cycling and isothermal aging[J]. Journal of Alloys and Compounds,2012, 510(1):38-45.

[6]JOO S M, KIM H K. Shear deformation behavior of a Sn–3Ag–0.5Cu single solder ball at intermediate strain rates[J]. Materials Science and Engineering A, 2011, 528(6):2711-2717.

[7]冉光龙,王波,黄伟,等. IMC厚度对混装焊点热疲劳寿命的影响研究[J].电子与封装, 2025, 25(1):010203.RAN G L, WANG B, HUANG W, et al. Study on the effect of IMC thickness on thermal fatigue life of hybrid solder joints[J]. Electronics&Packaging, 2025, 25(1):010203.

[8]XU T, HU X W, LI Y L, et al. The growth behavior of interfacial intermetallic compound between Sn–3.5Ag–0.5Cu solder and Cu substrate under different thermal-aged conditions[J]. Journal of Materials Science:Materials in Electronics, 2017, 28(24):18515-18528.

[9]LI X P, XIA J M, ZHOU M B, et al. Solder volume effects on the microstructure evolution and shear fracture behavior of ball grid array structure Sn–3.0Ag–0.5Cu solder interconnects[J]. Journal of Electronic Materials, 2011, 40(12):2425-2435.

[10]王曼,于治水,张培磊,等. Sn基钎料/Cu焊点Kirkendall空洞抑制研究[J].材料导报, 2015, 29(12):148-151.WANG M, YU Z S, ZHANG P L, et, al. The study on suppressing the formation of Kirkendall voids in Sn based/Cu solder joint[J]. Materials Reports, 2015, 29(12):148-151.

[11]KHATIBI G, KOTAS A B, LEDERER M. Effect of aging on mechanical properties of high temperature Pb-rich solder joints[J].Microelectronics Reliability, 2018, 85:1-11.

[12]KIM J, JUNG S B, YOON J W. Optimal Ni(P)thickness and reliability evaluation of thin-Au/Pd(P)/Ni(P)surface-finish with Sn–3.0Ag–0.5Cu solder joints[J]. Journal of Alloys and Compounds, 2019, 805:1013-1024.

[13]KIM J, JUNG S B, YOON J W. Effect of Ni(P)thickness in Au/Pd/Ni(P)surface finish on the electrical reliability of Sn–3.0Ag–0.5Cu solder joints during current-stressing[J]. Journal of Alloys and Compounds,2021, 850:156729.

[14]TSUKAMOTO H, NISHIMURA T, SUENAGA S, et al. The influence of solder composition on the impact strength of lead-free solder ball grid array joints[J]. Microelectronics Reliability, 2011, 51(3):657-667.

[15]陈平.先进封装Cu–Sn互连焊点界面金属间化合物研究进展[J].微纳电子技术, 2024, 61(11):110104.CHEN P. Research progress intermetallic compounds at the interface of Cu–Sn interconnect solder joints in advanced packaging[J].Micronanoelectronic Technology, 2024, 61(11):110104.

基本信息:

DOI:10.19289/j.1004-227x.2025.12.005

中图分类号:TN405

引用信息:

[1]刘刚,张文健,陈佳,等.印刷焊料对ABF基板在uHAST及HTST老化后焊接可靠性的影响[J].电镀与涂饰,2025,44(12):26-35.DOI:10.19289/j.1004-227x.2025.12.005.

投稿时间:

2025-05-27

投稿日期(年):

2025

终审时间:

2025-12-31

终审日期(年):

2025

审稿周期(年):

1

发布时间:

2025-12-12

出版时间:

2025-12-12

网络发布时间:

2025-12-12

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